Sensor generals and classification for semiconductor sensors (IEC 47E/120/CDV:1998)
€56.17
Semiconductor devices - Discrete devices - Hall elements (IEC 47E/121/CDV:1998)
Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Essential ratings and characteristics
€506.00
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
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Amendment 1 to IEC 60747-9: Insulated gate bipolar transistors (IGBTs) (IEC 47E/114/CDV:1998)
€91.03
Amendment 2 - Low-voltage switchgear and controlgear - Part 4: Contactors and motor-starters - Section 2: AC semiconductor motor controllers and starters
€11.00
Semiconductor devices - Part 9: Insulated-gate bipolar transistors (IGBTs)
€231.00
Amendment 1 - Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
€22.00
Amendment 1 - Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Essential ratings and characteristics
Dispositifs à semi-conducteurs - Procédures pour la certification d'une ligne de fabrication et la gestion de la qualité et guide pour l'obtention de la certification QML - Prescriptions provisoires.
€111.67
Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics
Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices
