Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
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Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current–Voltage Characteristics (Withdrawn 2023)
Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
€102.00
Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices (Withdrawn 2023)
Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)
€165.00
Radiation protection instrumentation. In vivo counters. Classification, general requirements and test procedures for portable, transportable and installed equipment
€374.00
Semiconductor devices. Mechanical and climatic test methods Handling, packing, labelling shipping of surface-mount devices sensitive to the combined effect moisture soldering heat
€316.00
Discrete semiconductor devices Metal-oxide field-effect transistors (MOSFETs) for power switching applications
Semiconductor devices. Mechanical and climatic test methods Soft error method for semiconductor devices with memory
€193.00
Semiconductor devices. Mechanical and climatic test methods Measurement of moisture diffusivity water solubility in organic materials used for semiconductor components
Semiconductor devices. Mechanical and climatic test methods Acoustic microscopy for plastic encapsulated electronic components
€269.00
Mechanical standardization of semiconductor devices Glossary tests and burn-in sockets for BGA, LGA, FBGA FLGA
Semiconductor devices. Mechanical and climatic test methods Board level drop method using an accelerometer
Semiconductor devices. Discrete devices accelerometers
€404.00
Semiconductor die products Requirements for information concerning electrical simulation
