Thermal standardization on semiconductor packages - Part 3: Thermal circuit simulation models of discrete semiconductor packages for transient analysis (IEC 63378-3:2025); German version EN IEC 63378-3:2025
€91.03
BS IEC 60747-8 Amd.2 Amendment 2 - Semiconductor devices Discrete Part 8: Field-effect transistors
€23.00
Low-voltage switchgear and controlgear Semiconductor circuit-breakers
€404.00
BS EN IEC 62047-61 Semiconductor devices - Micro-electromechanical systems Part 61: Evaluation methods of localized deformation and stretchability for Hybrid MEMS materials
BS EN IEC 62047-62 Semiconductor devices - Micro-electromechanical systems Part 62: Electrical resistance test method for hybrid MEMS materials under combined tensile and torsional deformation
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module (IEC 60749-34-1:2025); German version EN IEC 60749-34-1:2025
€116.64
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the macro photoluminescence for epitaxial wafers micro light diodes
€193.00
BS EN IEC 63608-2 Reliability evaluation methods for vibration energy harvesters Part 2: Temperature and humidity
BS EN IEC 60747-14-13 Semiconductor devices Part 14-13: sensors - Performance test methods for spectral
Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
€102.00
BS EN IEC 63551-2 Semiconductor devices - Chip-scale testing for autonomous vehicles Part 2: Optical performance of LiDAR
Semiconductor devices Microwave integrated circuits. Power detectors
€316.00
Draft BS IEC 63551-1 Semiconductor devices. Chip-scale testing for autonomous vehicles Part 1: Combined LD-PD LiDAR
Semiconductor devices - Part 16-11: Microwave integrated circuits - Power detectors
€286.00
Dispositifs à semiconducteurs - Méthodes d'essai mécaniques et climatiques - Partie 29 : Essai de verrouillage
€135.32
