31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
25/30511310 DC:2025

25/30511310 DC:2025

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Draft BS EN 62047-56 Micro-electromechanical devices Part 56. Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor

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25/30510635 DC:2025

25/30510635 DC:2025

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Draft BS EN 63567-3 Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment Part 3: Nano-scale wafer surface method using UV light

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25/30531414 DC:2025

25/30531414 DC:2025

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BS IEC 63672 Guidelines for evaluating DV/DT robustness of SIC power devices

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25/30531418 DC:2025

25/30531418 DC:2025

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BS IEC 63673 Guidelines for Gate Charge (QG) test method for SIC MOSFET

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PR NF EN IEC 60749-23, C96-022-23PR (01/2025)

PR NF EN IEC 60749-23, C96-022-23PR (01/2025)

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Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 23 : durée de vie en fonctionnement à haute température

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BS EN IEC 60749-20-1:2026

BS EN IEC 60749-20-1:2026

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Semiconductor devices ? Mechanical and climatic test methods Part 20-1: Handling, packing, labelling shipping of surface-mount sensitive to the combined effect moisture soldering heat

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BS IEC 60747-6:2016

BS IEC 60747-6:2016

Superseded Historical

Semiconductor devices Discrete devices. Thyristors

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BS EN IEC 63378-6:2026

BS EN IEC 63378-6:2026

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Thermal standardization on semiconductor packages resistance and capacitance model for transient temperature prediction at junction measurement points

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NF EN 60749-24, C96-022-24 (11/2005)

NF EN 60749-24, C96-022-24 (11/2005)

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 24 : accelerated moisture resistance - Unbiased HAST - Dispositifs à semiconducteurs

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NF EN 60749-7, C96-022-7 (02/2012)

NF EN 60749-7, C96-022-7 (02/2012)

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 7 : internal moisture content measurement and the analysis of other residual gases - Dispositifs à semiconducteurs

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NF EN 60747-15, C96-015 (06/2013)

NF EN 60747-15, C96-015 (06/2013)

Superseded Historical

Semiconductor devices - Discrete devices - Part 15 : isolated power semiconductor devices - Dispositifs à semi-conducteurs

€111.67

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NF EN 60749-21, C96-022-21 (06/2012)

NF EN 60749-21, C96-022-21 (06/2012)

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 21 : solderability - Dispositifs à semiconducteurs

€82.00

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NF EN 60749-5, C96-022-5 (07/2017)

NF EN 60749-5, C96-022-5 (07/2017)

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 5 : steady-state temperature humidity bias life test

€77.67

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NF EN IEC 60749-26, C96-022-26 (03/2018)

NF EN IEC 60749-26, C96-022-26 (03/2018)

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 26 : electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

€141.33

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NF EN 60191-4/A1, C96-013-4/A1 (05/2018)

NF EN 60191-4/A1, C96-013-4/A1 (05/2018)

Superseded Historical

Mechanical standardization of semiconductor devices - Part 4 : coding system and classification into forms of package outlines for semiconductor device packages

€95.67

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