MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES. PART 4: CODING SYSTEM AND CLASSIFICATION INTO FORMS OF PACKAGE OUTLINES FOR SEMICONDUCTOR DEVICES.
€36.00
Semiconductor devices - Visual inspection of discrete semiconductor devices (IEC 47E(Secretariat)6:1994)
€214.30
Amendment 2 - Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
€11.00
Semiconductor devices; additional ratings and characteristics and measuring methods for power switching bipolar transistors (IEC 47(Secretariat)1275:1992)
€41.78
Semiconductor devices; amendments of the rules for subscripts and indication of polarity (IEC 47(Central Office)1336:1992)
€34.30
Semiconductor devices; additional essential ratings and characteristics for microwave field effect transistors into IEC 60747-4 (IEC 47E(Secretariat)3:1993)
Semiconductor devices; revised and additional measuring methods for microwave field effect transistors; amendment to IEC 47(Central Office)1261 (IEC 47E(Secretariat)4:1993)
Semiconductor devices; measuring methods for thyristors; revision of IEC 747-6, chapter IV (IEC 47(Secretariat)1322:1993)
€91.03
Semiconductor devices; supplement to IEC 60747-7: bipolar transistors, pulse methods for collector-base cutt-off current and emitter-base cutt-off current (IEC 47E(Secretariat)5:1993)
Amendment 2 - Semiconductor devices - Discrete devices - Part 6: Thyristors
€369.00
Semiconductor devices; protections of electrostatic-sensitive devices (IEC 47(Secretariat)1330:1993)
€105.42
Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits - Sixth supplement
Test Method for Determining Carrier Density in Silicon Epitaxial Layers by Capacitance-Voltage Measurements on Fabricated Junction or Schottky Diodes (Withdrawn 2001)
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Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
MICROPROCESSOR SYSTEM BUS FOR 1 TO 4 BYTE DATA.
€192.00
