IEC 62047-40:2021
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IEC 62047-40:2021

IEC 62047-40:2021 Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold

Summary

IEC 62047-40:2021(E) specifies the test conditions and methods of micro-electromechanical inertial shock switch threshold. This document applies to normally open micro-electromechanical inertial shock switch.

Technical characteristics

Publisher International Electrotechnical Commission (IEC)
Publication Date 09/03/2021
Edition 1.0
Page Count 11
EAN ---
ISBN ---
Weight (in grams) ---
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