Amendment 2 - Mechanical standardization of semiconductor devices. Part 3: General rules for the preparation of outline drawings of integrated circuits
€11.00
Low-voltage switchgear and controlgear - Part 4: Contactors and motor-starters - Section 2: AC semiconductor motor controllers and starters
€418.00
Seventeenth supplement
Sixteenth supplement
€231.00
GRAPHICAL SYMBOLS FOR DIAGRAMS. SEMICONDUCTORS AND ELECTRON TUBES.
€77.00
Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section 3: Blank detail specification for case-rated field effect transistors for switching applications
€127.00
Pin 1 mark for identification in automatic handling systems (IEC 47D/53/CD:1994)
€41.78
Harmonized system of quality assessment for electronic components. Blank detail specification: Thyristor diodes, transient overvoltage suppressors
€193.00
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: light emitting diodes and infrared emitting diodes for fibre optic system or sub-system
Amendment 1 - Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
Amendment 3 - Semiconductor devices. Integrated circuits. Part 1: General
Semiconductor devices, mechanical standardization - Wire-ended diode package (small signal diode), package outline A54 in IEC 191-2 (IEC 47D(Sec)30:1994)
Standard Practice for Testing for Leaks Using the Halogen Leak Detector (Alkali-Ion Diode)
This product is not for sale, please contact us for more information
Standard Practice for Testing for Leaks Using the Halogen Leak Detector(Alkali-Ion Diode) (Withdrawn 2013)
Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components
