IEC 62951-8:2023
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IEC 62951-8:2023

IEC 62951-8:2023 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory

Summary

IEC 62951-8:2023 (E) defines terms and specifies the test method for evaluating the stretchability, flexibility, and stability of flexible resistive memory. The test method descriptions include experimental procedures and the equipment to be used. It also includes general requirements for test conditions such as the temperature and relative humidity of the testing environment. The test method described in this document focuses on stability evaluation rather than reliability.

Technical characteristics

Publisher International Electrotechnical Commission (IEC)
Publication Date 01/19/2023
Edition 1.0
Page Count 14
EAN ---
ISBN ---
Weight (in grams) ---
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