SEMICONDUCTOR DEVICES. MECHANICAL AND CLIMATIC TEST METHODS.
€73.00
Semiconductor devices; basic concepts defining the scope of TC 47; identical with IEC 47(Central Office)1220
€34.30
Semiconductor devices; blank detail specification for rectifier diodes for currents greater than 100 A; identical with IEC 47(Central Office)1279.
€48.79
Semiconductor devices thyristors; revision of chapter III of IEC 747-6; identical with IEC 47(Central Office)1303
€69.91
Semiconductor devices thyristors; revision of chapters IV and V and the appendix of IEC 747-6; identical with IEC 47(Central Office)1304
€77.20
Semiconductor devices; terms and definitions for semiconductor pressure sensors; identical with IEC 47(Secretariat)1253
Semiconductor devices; internal moisture content; identical with IEC 47(Secretariat)1257
€41.78
Semiconductor devices; measuring methods for GaAs field-effect transistors used in microwave applications; identical with IEC 47(Central office)1261
Semiconductor devices; concepts for voltage-reference and voltage-regulator diodes; identical with IEC 47(Central Office)1222
Semiconductor devices; concepts for element of semiconductor devices and other related concepts; identical with IEC 47(Central Office)1223
Semiconductor devices; concepts and letter symbols for direct and alternating quantities; identical with IEC 47(Central Office)1224
Semiconductor devices; mechanical and climatic test method; internal moisture content measurement by mass spectrometry method; identical with IEC 47(Central Office)1252
Blank detail specification : phototransistors, photodarlington transistors, phototransistor arrays
€95.67
Blank detail specification : ambient rated photocouplers with phototransistor output
€111.67
Semiconductor devices letter symbols for the logarithmic scale unit "decibel"; identical with IEC 47(Central Office)1319
