31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
UNE 21302-521:1992

UNE 21302-521:1992

Superseded Historical

ELECTROTECHNICAL VOCABULARY. SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS.

€96.00

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IEC 60747-2:1983/AMD1:1992

IEC 60747-2:1983/AMD1:1992

Superseded Historical

Amendment 1 - Semiconductor devices - Discrete devices - Part 2: Rectifier diodes

€176.00

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BS QC 750111:1991

BS QC 750111:1991

Withdrawn Most Recent

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bidirectional triode thyristors (triacs), ambient or case-rated, up to 100 A

€193.00

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ASTM F616-92

ASTM F616-92

Withdrawn Most Recent

Standard Test Method for Measuring MOSFET Drain Leakage Current

This product is not for sale, please contact us for more information

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ASTM F980-92

ASTM F980-92

Superseded Historical

Guide for The Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

This product is not for sale, please contact us for more information

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IEC 60749:1984/AMD1:1991

IEC 60749:1984/AMD1:1991

Superseded Historical

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods.

€127.00

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IEC 60747-6:1983/AMD1:1991

IEC 60747-6:1983/AMD1:1991

Superseded Historical

Amendment 1 - Semiconductor devices - Discrete devices - Part 6: Thyristors

€176.00

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IEC 60747-3:1985/AMD1:1991

IEC 60747-3:1985/AMD1:1991

Superseded Historical

Amendment 1 - Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes

€22.00

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BS QC 750104:1991

BS QC 750104:1991

Withdrawn Most Recent

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bipolar transistors for switching applications

€193.00

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BS QC 750107:1991

BS QC 750107:1991

Withdrawn Most Recent

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for high-frequency amplifications

€193.00

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DIN IEC 60747-3-1:1991-11

DIN IEC 60747-3-1:1991-11

Withdrawn Most Recent

Semiconductor devices - Discrete devices - Part 3: Signal diodes and regulator diodes; Section one: Blank detail specification: Signal diodes, switching diodes and controlled-avalanche diodes; Identical with IEC 60747-3-1:1986

€56.17

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DIN IEC 47(CO)1221:1991-11

DIN IEC 47(CO)1221:1991-11

Withdrawn Most Recent

Semiconductor devices; drift and instability; terms and definitions; identical with IEC 47(Central Office)1221

€34.30

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IEC 60747-11:1985/AMD1:1991

IEC 60747-11:1985/AMD1:1991

Withdrawn Most Recent

Amendment 1 - Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices

€11.00

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IEEE 1005:1991

IEEE 1005:1991

Superseded Historical

IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays

€95.00

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DIN IEC 47(CO)1191:1991-10

DIN IEC 47(CO)1191:1991-10

Withdrawn Most Recent

Semiconductor devices; measuring methods for threshold voltage and resistance of Gunn diodes; identical with IEC 47(Central Office)1191

€34.30

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