Standard Guide for Neutron Irradiation of Unbiased Electronic Components
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Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Standard Practice for Radiologic Examination of Semiconductors and Electronic Components
Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics
Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
Standard Practice for Testing for Leaks Using the Halogen Leak Detector(Alkali-Ion Diode) (Withdrawn 2013)
Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
IEC 60821:1991/AMD1:1999 Amendment 1 - VMEbus - Microprocessor system bus for 1 byte to 4 byte data
€46.00
IEC 60191-6-3:2000 Mechanical standardization of semiconductor devices - Part 6-3: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of quad flat packs (QFP)
€133.00
IEC 60747-14-2:2000 Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements
€93.00
IEC 60191-6-6:2001 Mechanical standardization of semiconductor devices - Part 6-6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for fine pitch land grid array (FLGA)
