IEC 60747-18-1:2019
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IEC 60747-18-1:2019

IEC 60747-18-1:2019 Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors

Summary

IEC 60747-18-1:2019 (E) specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.

Technical characteristics

Publisher International Electrotechnical Commission (IEC)
Publication Date 05/20/2019
Edition 1.0
Page Count 26
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Weight (in grams) ---
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