IEC 62047-34:2019
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IEC 62047-34:2019

IEC 62047-34:2019 Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer

Summary

IEC 62047-34:2019 (E) describes test conditions and test methods of electric character, static performances and thermal performances for MEMS pressure-sensitive devices. This document applies to test for both open and closed loop piezoresistive MEMS pressure devices on wafer.

Technical characteristics

Publisher International Electrotechnical Commission (IEC)
Publication Date 04/05/2019
Edition 1.0
Page Count 16
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ISBN ---
Weight (in grams) ---
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