31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
DD IEC/PAS 60747-17:2011

DD IEC/PAS 60747-17:2011

Superseded Historical

Semiconductor devices. Discrete devices Magnetic and capacitive coupler for basic reinforced isolation

€316.00

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BS EN 60749-27:2006+A1:2012

BS EN 60749-27:2006+A1:2012

Active Most Recent

Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)

€193.00

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BS EN 62047-20:2014

BS EN 62047-20:2014

Active Most Recent

Semiconductor devices. Micro-electromechanical devices Gyroscopes

€374.00

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BS EN 62047-21:2014

BS EN 62047-21:2014

Active Most Recent

Semiconductor devices. Micro-electromechanical devices Test method for Poisson's ratio of thin film MEMS materials

€193.00

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BS EN 62047-22:2014

BS EN 62047-22:2014

Active Most Recent

Semiconductor devices. Micro-electromechanical devices Electromechanical tensile test method for conductive thin films on flexible substrates

€165.00

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BS EN 62779-1:2016

BS EN 62779-1:2016

Active Most Recent

Semiconductor devices. interface for human body communication General requirements

€193.00

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BS EN 62047-16:2015

BS EN 62047-16:2015

Active Most Recent

Semiconductor devices. Micro-electromechanical devices Test methods for determining residual stresses of MEMS films. Wafer curvature and cantilever beam deflection

€193.00

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BS EN 62031:2008+A2:2015

BS EN 62031:2008+A2:2015

Superseded Historical

LED modules for general lighting. Safety specifications

€269.00

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BS EN 62779-2:2016

BS EN 62779-2:2016

Active Most Recent

Semiconductor devices. interface for human body communication Characterization of interfacing performances

€193.00

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BS EN 62047-5:2011

BS EN 62047-5:2011

Active Most Recent

Semiconductor devices. Micro-electromechanical devices RF MEMS switches

€316.00

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BS EN 62047-9:2011

BS EN 62047-9:2011

Active Most Recent

Semiconductor devices. Micro-electromechanical devices Wafer to wafer bonding strength measurement for MEMS

€269.00

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BS IEC 62483:2013

BS IEC 62483:2013

Active Most Recent

Environmental acceptance requirements for tin whisker susceptibility of tin and tin alloy surface finishes on semiconductor devices

€374.00

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BS EN 60749-42:2014

BS EN 60749-42:2014

Active Most Recent

Semiconductor devices. Mechanical and climatic test methods Temperature humidity storage

€165.00

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BS IEC 62047-27:2017

BS IEC 62047-27:2017

Active Most Recent

Semiconductor devices. Micro-electromechanical devices Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT)

€183.00

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BS IEC 62047-28:2017

BS IEC 62047-28:2017

Active Most Recent

Semiconductor devices. Micro-electromechanical devices Performance testing method of vibration-driven MEMS electret energy harvesting

€183.00

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