31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
UTE C86-614/A10, C86-614/A10U (04/1987)

UTE C86-614/A10, C86-614/A10U (04/1987)

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Additif 10 à la publication UTE C 86-614 de février 1977

€156.67

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UTE C86-614/A9, C86-614/A9U (03/1986)

UTE C86-614/A9, C86-614/A9U (03/1986)

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Additif 9 à la publication UTE C 86-614 de février 1977

€65.33

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NF C96-711 (08/1973)

NF C96-711 (08/1973)

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Semiconducteurs - Transistors à effet de champ - Prescriptions générales.

€192.50

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UTE C96-711, C96-711U (07/1973)

UTE C96-711, C96-711U (07/1973)

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Semiconducteurs - Transistors à effet de champ - Recueil de feuilles particulières.

€125.00

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NF C96-711/A1 (08/1974)

NF C96-711/A1 (08/1974)

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SEMICONDUCTEURS. TRANSISTORS A EFFET DE CHAMP. PRESCRIPTIONS GENERALES.

€86.50

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NF C96-832 (06/1981)

NF C96-832 (06/1981)

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Semiconducteurs - Diodes hyperfréquences - Diodes schottky - Prescriptions générales.

€184.00

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NF C86-617/A1 (06/1981)

NF C86-617/A1 (06/1981)

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Additif 1 à la norme NF C 87-617 de février 1977 (homologuée en juin 1981)

€34.00

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ASTM F1190-18

ASTM F1190-18

Superseded Historical

Standard Guide for Neutron Irradiation of Unbiased Electronic Components

This product is not for sale, please contact us for more information

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ASTM F1192-11(2018)

ASTM F1192-11(2018)

Superseded Historical

Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

This product is not for sale, please contact us for more information

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ASTM F1190-24

ASTM F1190-24

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Standard Guide for Neutron Irradiation of Unbiased Electronic Components

€65.00

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ASTM F1192-24

ASTM F1192-24

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Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

€72.00

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BS EN 120003:1993

BS EN 120003:1993

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Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays

€193.00

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BS EN 120004:1993

BS EN 120004:1993

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Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Ambient rated photocouplers with phototransistor output

€269.00

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DIN IEC 60747-15:2001-11

DIN IEC 60747-15:2001-11

Superseded Historical

Discrete semiconductor devices - Part 15: Isolated power devices (IEC 47E/189/CDV:2001)

€134.02

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DIN EN 60749-5:2002-06

DIN EN 60749-5:2002-06

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady state temperature humidity bias life test (IEC 47/1600/CDV:2002); German version prEN 60749-5:2002

€48.79

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