Superseded
Standard
Historical
IEC 62007-2:1997+AMD1:1998 Consolidated
Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
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Summary
Describes the measuring methods applicable to the semiconductor devices to be used in the field of fibre optic systems and subsystems. This consolidated version consists of the first edition (1997) and its amendment 1 (1998). Therefore, no need to order amendment in addition to this publication.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 02/26/1999 |
| Release Date | 02/26/1999 |
| Cancellation Date | 01/26/2009 |
| Edition | 1.1 |
| Page Count | 117 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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