IEC 60749-13:2002/COR1:2003
Superseded Standard Corrigendum
Historical

IEC 60749-13:2002/COR1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Most recent standard

Summary

Modification of the validity date: now put at 2007.

Technical characteristics

Publisher International Electrotechnical Commission (IEC)
Publication Date 08/13/2003
Release Date 08/13/2003
Cancellation Date 02/15/2018
Edition 1
Page Count 0
EAN ---
ISBN ---
Weight (in grams) ---
No products.

Previous versions

No products.
Also available in subscription
Contact us