Superseded
Standard
Historical
IEC 60749-13:2002
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Preview
Summary
Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. The contents of the corrigendum of August 2003 have been included in this copy.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 04/12/2002 |
| Release Date | 04/12/2002 |
| Cancellation Date | 02/15/2018 |
| Edition | 1 |
| Page Count | 9 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
12/04/2002
Superseded
Historical
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