Superseded
Standard
Historical
IEC 60749-29:2003
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Preview
Summary
Covers the I-test and the overvoltage latch-up testing of integrated circuits.
The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "No Trouble Found" and "Electrical Overstress" failures due to latch-up.
The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "No Trouble Found" and "Electrical Overstress" failures due to latch-up.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 11/04/2003 |
| Release Date | 11/04/2003 |
| Cancellation Date | 04/07/2011 |
| Edition | 1 |
| Page Count | 41 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
04/11/2003
Superseded
Historical
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