Superseded
Standard
Historical
IEC 60749-26:2003
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
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Summary
Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model electrostatic discharge. The objective is to provide reliable, repeatable test results so that accurate classifications can be performed.
The testing shall be selected from this test method or the machine model test method (see IEC 60749-27).
The testing shall be selected from this test method or the machine model test method (see IEC 60749-27).
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 10/21/2003 |
| Release Date | 10/21/2003 |
| Cancellation Date | 07/18/2006 |
| Edition | 1 |
| Page Count | 27 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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