Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
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Semiconductor devices. Discrete devices Optoelectronic lasers
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High-voltage switchgear and controlgear Alternating current fused circuit-switchers for rated voltages above 1 kV up to including 52
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Semiconductor die products Requirements for procurement and use
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Produits de matrice de semi-conducteur - Partie 1 : exigences pour l'acquisition et l'utilisation
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Produits de matrice de semi-conducteur - Partie 2 : formats de données d'échange
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Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
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Semiconductor devices. Discrete devices Bipolar transistors for power switching applications
Board level drop test method of components for handheld electronicproduc ts
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Electrostatics Standard test methods for specific applications Electrostatic classification of flexible intermediate bulk containers (FIBC)
Semiconductor devices. Mechanical and climatic test methods Solderability
Semiconductor die products - Part 2: Exchange data formats (IEC 62258-2:2005); German version EN 62258-2:2005, text in English.
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Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method of components for handheld electronic products (IEC 47/1824/CD:2005)
€98.32
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 21 : brasabilité
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 34 : cycles en puissance
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