31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
DIN EN 60747-16-1:2007-10

DIN EN 60747-16-1:2007-10

Superseded Historical

Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (IEC 60747-16-1:2001 + A1:2007); German version EN 60747-16-1:2002 + A1:2007.

€145.14

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DIN EN 60749-20:2007-10

DIN EN 60749-20:2007-10

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 47/1916/CDV:2007); German version prEN 60749-20:2007

€105.42

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DIN IEC 60747-16-4/A1:2007-10

DIN IEC 60747-16-4/A1:2007-10

Superseded Historical

Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (IEC 47E/337/CD:2007)

€48.79

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IEC 60747-5-5:2007

IEC 60747-5-5:2007

Superseded Historical

Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers

€369.00

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IEC 60747-9:2007

IEC 60747-9:2007

Superseded Historical

Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)

€369.00

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DIN IEC 60747-7:2007-09

DIN IEC 60747-7:2007-09

Withdrawn Most Recent

Semiconductor devices - Discrete devices - Part 7: Bipolar transistors (BTRs) (IEC 47E/324/CD:2007)

€385.89

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IEC TR 62258-4:2007

IEC TR 62258-4:2007

Superseded Historical

Semiconductor die products - Part 4: Questionnaire for die users and suppliers

€127.00

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DIN IEC 62416:2007-08

DIN IEC 62416:2007-08

Superseded Historical

Hot Carrier Test on MOS Transistors (IEC 47/1902/CD:2007)

€63.27

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DIN IEC 62047-6:2007-07

DIN IEC 62047-6:2007-07

Superseded Historical

Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 47/1900/CD:2007)

€91.03

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DIN IEC 60747-14-5:2007-07

DIN IEC 60747-14-5:2007-07

Superseded Historical

Semiconductor devices - Discrete devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor (IEC 47E/326/CD:2007)

€69.91

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BS IEC 60191-1:2007

BS IEC 60191-1:2007

Superseded Historical

Mechanical standardization of semiconductor devices General rules for the preparation outline drawings discrete

€316.00

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IEC 60191-6-13:2007

IEC 60191-6-13:2007

Superseded Historical

Mechanical standardization of semiconductor devices - Part 6-13: Design guideline of open-top-type sockets for Fine-pitch Ball Grid Array and Fine-pitch Land Grid Array (FBGA/FLGA)

€88.00

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DIN IEC 60747-8:2007-06

DIN IEC 60747-8:2007-06

Withdrawn Most Recent

Semiconductor devices - Discrete devices - Part 8: Field-effect transistors (IEC 47E/320/CD:2007)

€190.65

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DIN IEC 60747-15:2007-06

DIN IEC 60747-15:2007-06

Superseded Historical

Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (IEC 47E/322/CD:2007)

€122.34

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IEC 60191-1:2007

IEC 60191-1:2007

Superseded Historical

Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices

€286.00

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