31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
UNE-EN 62031:2009

UNE-EN 62031:2009

Superseded Historical

LED modules for general lighting - Safety specifications

€66.00

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DIN IEC 62615:2009-04

DIN IEC 62615:2009-04

Withdrawn Most Recent

Electrostatic Discharge Sensitivity Testing - Transmission Line Pulse (TLP) - Component Level (IEC 47/2006/CDV:2008)

€105.42

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BS EN 62007-1:2009

BS EN 62007-1:2009

Superseded Historical

Semiconductor optoelectronic devices for fibre optic system applications Specification template essential ratings and characteristics

€316.00

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DIN IEC 60747-16-5:2009-03

DIN IEC 60747-16-5:2009-03

Superseded Historical

Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (IEC 47E/374/CD:2008)

€134.02

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IEC 62007-2:2009

IEC 62007-2:2009

Superseded Historical

Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods

€286.00

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IEC 60749-20:2008

IEC 60749-20:2008

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

€231.00

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IEEE 1620:2008

IEEE 1620:2008

Withdrawn Most Recent

IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials

€95.00

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NF EN 62031, C71-250 (12/2008)

NF EN 62031, C71-250 (12/2008)

Superseded Historical

LED modules for general lighting - Safety specifications - Modules de del pour éclairage général

€95.67

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NF EN 60191-6-13, C96-013-6-13 (12/2008)

NF EN 60191-6-13, C96-013-6-13 (12/2008)

Superseded Historical

Normalisation mécanique des dispositifs à semiconducteurs - Partie 6-13 : guide de conception pour les supports sans couvercle pour les boîtiers matriciels à billes et à pas fins et les boîtiers matriciels à zone de contact plate et à pas fins (FBGA/FLGA)

€95.67

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IEC 60700-1:1998+AMD1:2003+AMD2:2008 Consolidated

IEC 60700-1:1998+AMD1:2003+AMD2:2008 Consolidated

Superseded Historical

Thyristor valves for high voltage direct current (HVDC) power transmission - Part 1: Electrical testing

€627.00

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IEC 62007-1:2008

IEC 62007-1:2008

Superseded Historical

Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics

€286.00

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DIN IEC 62047-7:2008-09

DIN IEC 62047-7:2008-09

Superseded Historical

Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS FBAR Filter & Duplexer (IEC 47/1969/CD:2008)

€111.40

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IEC 60700-1:1998/AMD2:2008

IEC 60700-1:1998/AMD2:2008

Superseded Historical

Amendment 2 - Thyristor valves for high voltage direct current (HVDC) power transmission - Part 1: Electrical testing

€44.00

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IEC 62047-4:2008

IEC 62047-4:2008

Superseded Historical

Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS

€127.00

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DIN EN 60749-37:2008-08

DIN EN 60749-37:2008-08

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 60749-37:2008); German version EN 60749-37:2008.

€105.42

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