Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
€94.00
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
€11.00
Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current–Voltage Characteristics (Withdrawn 2023)
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Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics
Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
€176.00
Semiconductor devices Magnetic and capacitive coupler for basic reinforced insulation
€193.00
Semiconductor devices - Part 3: Signal (including switching diodes) and regulator diodes (IEC 47E/395/CD:2010)
€157.10
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
€22.00
Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials (IEC 47F/59/CD:2010)
€98.32
Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for linear thermal expansion coefficients of MEMS materials (IEC 47F/49/CD:2010)
€91.03
Semiconductor devices - Micro-electromechanical devices - Part 12: A method for fatigue testing thin film materials using the resonant vibration of a MEMS structure (IEC 47F/43/CD:2010)
€111.40
Semiconductor devices - Micro-electromechanical devices - Part 10: Micropillar compression test for MEMS materials (IEC 47F/48/CD:2010)
€69.91
Semiconductor devices - Micro electro mechanical devices - Part 13: Bend- and shear- test methods of measuring adhesive strength for MEMS structures (IEC 47F/44/CD:2010)
