Superseded
Standard amendment
Historical
IEC 60749-23:2004/AMD1:2011
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
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Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 01/27/2011 |
| Release Date | 01/27/2011 |
| Cancellation Date | 12/09/2025 |
| Edition | 1 |
| Page Count | 5 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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