31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
IEC 60749-26:2013

IEC 60749-26:2013

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

€325.00

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NF EN 60191-1, C96-013-1 (02/2013)

NF EN 60191-1, C96-013-1 (02/2013)

Superseded Historical

Normalisation mécanique des dispositifs à semiconducteurs - Partie 1 : règles générales pour la préparation des dessins d'encombrement des dispositifs discrets

€138.00

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DIN EN 60747-6:2013-01

DIN EN 60747-6:2013-01

Withdrawn Most Recent

Semiconductor devices - Discrete devices - Part 6: Thyristors (IEC 47E/444/CD:2012)

€315.42

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NF EN 62341-6-3, C96-541-6-3 (12/2012)

NF EN 62341-6-3, C96-541-6-3 (12/2012)

Withdrawn Most Recent

Organic light emitting diode (OLED) displays - Part 6-3 : measuring methods of image quality

€126.00

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DIN EN 62047-16:2012-11

DIN EN 62047-16:2012-11

Superseded Historical

Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods (IEC 47F/125/CD:2012)

€69.91

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DIN EN 62047-22:2012-11

DIN EN 62047-22:2012-11

Superseded Historical

Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (IEC 47F/128/CD:2012)

€63.27

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DIN EN 62047-21:2012-11

DIN EN 62047-21:2012-11

Superseded Historical

Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials (IEC 47F/127/CD:2012)

€77.20

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DIN EN 62047-15:2012-11

DIN EN 62047-15:2012-11

Superseded Historical

Semiconductor devices - Micro-electromechanical devices - Part 15: Test method of bonding quality between PDMS and glass (IEC 47F/126/CD:2012)

€69.91

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IEC 62031:2008/AMD1:2012

IEC 62031:2008/AMD1:2012

Superseded Historical

Amendment 1 - LED modules for general lighting - Safety specifications

€22.00

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IEC 62031:2008+AMD1:2012 Consolidated

IEC 62031:2008+AMD1:2012 Consolidated

Superseded Historical

LED modules for general lighting - Safety specifications

€187.00

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DIN EN 60747-15:2012-08

DIN EN 60747-15:2012-08

Superseded Historical

Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (IEC 60747-15:2010); German version EN 60747-15:2012.

€111.40

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DIN EN 62047-20:2012-07

DIN EN 62047-20:2012-07

Superseded Historical

Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes (IEC 47F/122/CD:2012)

€167.66

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DIN EN 60749-42:2012-07

DIN EN 60749-42:2012-07

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature humidity storage (IEC 47/2131/CD:2012)

€63.27

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DIN EN 60749-28:2012-07

DIN EN 60749-28:2012-07

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing - Direct contact charged device model (DC-CDM) (IEC 47/2123/CD:2012)

€111.40

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NF EN 62341-6-2, C96-541-6-2 (07/2012)

NF EN 62341-6-2, C96-541-6-2 (07/2012)

Withdrawn Most Recent

Organic light emitting diode (OLED) displays - Part 6-2 : measuring methods of visual quality and ambient performance

€153.00

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