Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (IEC 47E/500/CDV:2015); German version EN 60747-16-1:2002/FprA2:2015
€63.27
Semiconductor devices. Discrete devices Optoelectronic Photocouplers
€374.00
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates (IEC 47/2224/CD:2015)
€84.58
LED modules for general lighting - Safety specifications - Modules de DEL pour éclairage général
€77.67
LED modules for general lighting - Safety specifications
€41.00
Semiconductor devices - Micro-electromechanical devices - Part 15: Test method of bonding strength between PDMS and glass
€44.00
LED modules for general lighting. Safety specifications
€269.00
Amendment 2 - LED modules for general lighting - Safety specifications
€11.00
€220.00
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 3: Vibration based electromagnetic energy harvesting (IEC 47/2198/CD:2014)
€105.42
Composants et dispositifs actifs en fibres optiques - Normes de fiabilité - Partie 3 : modules laser utilisés pour les télécommunications
€111.67
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 26 : essai de sensibilité aux décharges électrostatiques (DES) - Modèle du corps humain (HBM)
€166.33
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 47/2193/CD:2014)
Semiconductor devices - Wafer level reliability for semiconductor devices - Part 1: Copper stress migration test method (IEC 47/2191/CD:2014)
€128.22
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
€316.00
