Semiconductor devices - Mechanical and climatic test methods - Part 43 : guidelines for IC reliability qualification plans - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 43 : Directives concernant les plans de qualification de la fiabilité des CI
€138.00
Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers (IEC 47E/568/CD:2017)
€116.64
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 47/2386/CDV:2017); German version prEN 60749-12:2017
€48.79
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life
€193.00
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level
€355.00
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 47/2377/CDV:2017); German version prEN 60749-13:2017
€84.58
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
€286.00
Semiconductor devices - Mechanical and climatic test methods - Part 28 : Electrostatic Discharge (ESD) Sensitivity Testing - Direct contact charged device model (DC-CDM)
€166.33
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (IEC 47/2345/FDIS:2016); German version FprEN 60749-3:2016
€69.91
Static var compensators (SVC) - Testing of thyristor valves
€600.00
Amendment 2 - Static var compensators (SVC) - Testing of thyristor valves
€11.00
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
€44.00
Semiconductor devices - Mechanical and climatic test methods - Part 41: Reliability testing methods of non-volatile memory devices (IEC 47/2325/CD:2016)
€105.42
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
€325.00
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 47/2311/CDV:2016); German version prEN 60749-5:2016
€63.27
