Superseded
Standard
Historical
IEC 60749-43:2017
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
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Summary
IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 06/15/2017 |
| Release Date | 06/15/2017 |
| Cancellation Date | 08/25/2021 |
| Edition | 1 |
| Page Count | 74 |
| Themes | Safety |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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