Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
€56.17
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 47/2297/CDV:2016); German Version prEN 60749-6:2016
€48.79
Semiconductor devices - Micro-electromechanical devices - Part 29: Electromechanical relaxation test method for freestanding conductive thin-films under room temperature (IEC 47F/243/CD:2016)
€69.91
Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film (IEC 47F/241/CD:2016)
€105.42
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
€63.27
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors (IEC 47/2274/CD:2016)
€111.40
Semiconductor devices Discrete devices. Thyristors
€404.00
Semiconductor devices - Part 6: Discrete devices - Thyristors
€473.00
Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
€325.00
Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
€418.00
Semiconductor devices - Micro-electromechanical devices - Part 15: Test method of bonding strength between PDMS and glass (IEC 62047-15:2015); German version EN 62047-15:2015
€84.58
Semiconductor devices - Part 16-4: Micowave integrated circuits - Switches (IEC 47E/524/CD:2015)
Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 15 : méthode d'essai de la résistance de collage entre PDMS et verre
€95.67
Semiconductor devices - Micro-electromechanical devices - Part 28: Performance testing method of vibration-driven MEMS electret energy harvesting devices (IEC 47F/220/CD:2015)
€91.03
Semiconductor devices - Micro-electromechanical devices - Part 27: Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT) (IEC 47F/216/CD:2015)
