31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
ASTM F1191-88

ASTM F1191-88

Withdrawn Most Recent

Guide for the Radiation Testing of Semiconductor Memories (Withdrawn 1993)

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ASTM F1340-92

ASTM F1340-92

Withdrawn Most Recent

Test Method for Determining the Mean Interface Trap Density of Mosfets by Charge-Pumping (Withdrawn 1997)

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DIN EN IEC 60747-15:2024-06

DIN EN IEC 60747-15:2024-06

Superseded Historical

Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices (IEC 47E/812/CDV:2023); German and English version prEN IEC 60747-15:2023

€167.66

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DIN EN IEC 60749-5:2024-04

DIN EN IEC 60749-5:2024-04

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 47/2770/CDV:2022); German and English version prEN IEC 60749-5:2022

€69.91

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DIN EN IEC 63364-1:2023-10

DIN EN IEC 63364-1:2023-10

Superseded Historical

Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (IEC 47/2742/CDV:2021); German and English version prEN IEC 63364-1:2021

€84.58

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DIN EN IEC 60749-10:2023-06

DIN EN IEC 60749-10:2023-06

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly (IEC 60749-10:2022); German version EN IEC 60749-10:2022

€84.58

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DIN EN IEC 63203-402-3:2023-02

DIN EN IEC 63203-402-3:2023-02

Superseded Historical

Wearable electronic devices and technologies - Part 402-3: Performance measurement method of wearables - Series 2: Accuracy of Heart Rate Determination (IEC 124/167/CD:2021); Text in German and English

€98.32

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DIN EN IEC 60749-37:2023-02

DIN EN IEC 60749-37:2023-02

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 47/2651/CDV:2020); German and English version prEN IEC 60749-37:2020

€111.40

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DIN EN IEC 63373:2022-08

DIN EN IEC 63373:2022-08

Superseded Historical

Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices (IEC 63373:2022); German version EN IEC 63373:2022

€91.03

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DIN EN IEC 63287-2:2022-06

DIN EN IEC 63287-2:2022-06

Superseded Historical

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (IEC 47/2718/CDV:2021); German and English version prEN IEC 63287-2:2021

€98.32

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DIN EN IEC 60747-16-7:2021-07

DIN EN IEC 60747-16-7:2021-07

Superseded Historical

Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators (IEC 47E/734/CD:2020); Text in English

€128.22

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DIN EN IEC 60747-16-8:2021-07

DIN EN IEC 60747-16-8:2021-07

Superseded Historical

Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters (IEC 47E/735/CD:2020); Text in English

€122.34

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ASTM F72-21

ASTM F72-21

Superseded Historical

Standard Specification for Gold Wire for Semiconductor Lead Bonding (Withdrawn 2024)

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DIN EN IEC 63287-1:2020-06

DIN EN IEC 63287-1:2020-06

Superseded Historical

Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for LSI reliability qualification (IEC 47/2614/CDV:2020); German and English version prEN IEC 63287-1:2020

€150.65

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BS EN IEC 62031:2020

BS EN IEC 62031:2020

Superseded Historical

LED modules for general lighting. Safety specifications

€269.00

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