Superseded
Draft standard
Historical
DIN EN 60749-6:2016-09
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 47/2297/CDV:2016); German Version prEN 60749-6:2016
Preview
Summary
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 6: Lagerung bei hoher Temperatur (IEC 47/2297/CDV:2016); Deutsche Fassung prEN 60749-6:2016
Notes
Prévu pour remplacer DIN EN 60749-6 (2003-04).
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 09/01/2016 |
| Cancellation Date | 11/01/2017 |
| Page Count | 12 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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