Superseded
Standard
Historical
IEC PAS 62483:2006
Test method for measuring whisker growth on tin and tin alloy surface finishes
Preview
Summary
Provides the methodology applicable for studying tin whisker growth from finishes containing a predominance of tin (Sn). This test method may not be sufficient for applications with special requirements, e.g., military or aerospace. Additional requirements may be specified in the appropriate requirements document
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 09/12/2006 |
| Release Date | 09/12/2006 |
| Cancellation Date | 09/25/2013 |
| Edition | 1 |
| Page Count | 27 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
12/09/2006
Superseded
Historical
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