Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 2 : méthodes d'essais de traction des matériaux en couche mince
€77.96
Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 3 : éprouvettes d'essai normalisée en couche mince pour l'essai de traction
€59.50
Essai de stabilité de température en polarisation pour transistors à effet de champ métal-oxyde-semiconducteur (MOSFET)
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
€193.00
Semiconductor die products - Part 5: Requirements for information concerning electrical simulation
€88.00
Semiconductor die products - Part 6: Requirements for information concerning thermal simulation
€44.00
Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
€22.00
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
€176.00
Amendment 13 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
Amendment 14 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
Amendment 15 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
Radiation protection instrumentation. In vivo counters. Classification, general requirements and test procedures for portable, transportable and installed equipment
€374.00
