Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
€22.00
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
€88.00
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
€176.00
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Amendment 13 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
Amendment 14 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
€44.00
Amendment 15 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
Radiation protection instrumentation. In vivo counters. Classification, general requirements and test procedures for portable, transportable and installed equipment
€374.00
Amendment 12 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
Semiconductor devices - Part 1: General
€325.00
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz radiated emissions. TEM cell and wideband method
€269.00
Semiconductor devices - Mechanical and climatic test methods - Part 33 : accelerated moisture resistance - unbiased autoclave - Dispositifs à semiconducteurs
€70.33
Semiconductor devices - Mechanical and climatic test methods - Part 24 : accelerated moisture resistance - Unbiased HAST - Dispositifs à semiconducteurs
€25.33
Teleweb application Superteletext profile
€404.00
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
