Semiconductor devices - Mechanical and climatic test methods - Part 14 : robustness of terminations (lead integrity) - Dispositifs de semiconducteurs
€95.67
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)
€193.00
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state (IEC 60749-36:2003); German version EN 60749-36:2003.
€41.78
Semiconductor devices - Mechanical and climatic test methods - Part 1: General (IEC 60749-1:2002 + Corr. 1:2003); German version EN 60749-1:2003.
€56.17
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic encapsulated devices (internally induced) (IEC 60749-31:2002 + Corr. 1:2003); German version EN 60749-31:2003.
€34.30
Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength (IEC 60749-22:200 + Corr. 1:2003); German version EN 60749-22:2003.
€91.03
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing (IEC 60749-8:2002 + Corr. 1:2003 + Corr. 2:2003); German version EN 60749-8:2003.
€84.58
Semiconductor devices - Mechanical and climatic test methods - Part 25 : temperature cycling - Dispositifs de semiconducteurs
€52.00
Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)
€48.00
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
€36.00
Amendment 9 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
€22.00
Mechanical standardization of semiconductor devices - Part 6-10: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Dimensions of P-VSON
€88.00
Semiconductor devices - Mechanical and climatic test methods - Part 8 : sealing - Dispositifs à semiconducteurs
Semiconductor devices - Mechanical and climatic test methods - Part 22 : bond strength - Dispositifs à semiconducteurs
€82.00
Semiconductor devices - Mechanical and climatic test methods - Part 31 : flammability of plastic-encapsulated devices (internally induced) - Dispositifs à semiconducteurs
€43.67
