Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave
€41.00
Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST
€48.00
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
€51.00
Semiconductor devices - Part 16-4 : microwave integrated circuits - Switches
€101.00
Amendment 11 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
€22.00
Discrete semiconductor devices Metal-oxide field-effect transistors (MOSFETs) for power switching applications
€374.00
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST (IEC 60749-24:2004); German version EN 60749-24:2004
€63.27
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave (IEC 60749-33:2004); German version EN 60749-33:2004
€56.17
Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
€231.00
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) (IEC 60749-14:2003); German version EN 60749-14:2003.
€91.03
Semiconductor devices - Mechanical and climatic test methods - Part 23 : high temperature operating life - Dispositifs à semiconducteurs
€37.50
Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)
€165.00
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
€63.00
