Active
, Modified
Standard
Most Recent
UNE-EN 60749-23:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Preview
No description.
Technical characteristics
| Publisher | Asociacion Espanola de Normalizacion y Certificacion (AENOR) |
| Publication Date | 03/16/2005 |
| Page Count | 12 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
Modified by
Replaces
16/03/2005
Active
, Modified
Most Recent
Previous versions
16/03/2005
Active
, Modified
Most Recent
No products.