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UNE-EN 60749-23:2005/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
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| Publisher | Asociacion Espanola de Normalizacion y Certificacion (AENOR) |
| Publication Date | 12/21/2011 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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