Semiconductor die products - Part 8: EXPRESS model schema for data exchange
€231.00
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
€88.00
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films (IEC 62374:2007); German version EN 62374:2007
€105.42
Semiconductor devices Microwave integrated circuits. Frequency prescalers
€316.00
Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers
€413.00
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films - Dispositifs à semiconductors
€111.96
Semiconductor die products XML schema for data exchange
€269.00
Amendment 1 - Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers
€11.00
Semiconductor die products - Part 7: XML schema for data exchange
Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
€473.00
Mechanical standardization of semiconductor devices Glossary tests and burn-in sockets for BGA, LGA, FBGA FLGA
€165.00
Amendment 16 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
€22.00
Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA
€44.00
Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films
€176.00
Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
€781.00
