DIN EN 62374:2008-02
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DIN EN 62374:2008-02

Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films (IEC 62374:2007); German version EN 62374:2007

Summary

Halbleiterbauelemente - Prüfung des zeitabhängigen dielektrischen Durchbruchs (TDDB) für dielektrische Gate-Schichten (IEC 62374:2007); Deutsche Fassung EN 62374:2007

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 02/01/2008
Page Count 24
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ISBN ---
Weight (in grams) ---
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