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IEC 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
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Summary
Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 07/18/2006 |
| Release Date | 07/18/2006 |
| Edition | 1 |
| Page Count | 27 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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18/07/2006
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