Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage GaN-based light diodes based on photocurrent spectroscopy
€183.00
BS EN 60747-16-11 Semiconductor devices Part 16-11. Microwave integrated circuits - Power detectors
€23.00
Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Fast BTI MOSFET
€269.00
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
€88.00
Semiconductor devices - Part 5-16: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy
€127.00
Semiconductor devices bio sensors. Evaluation method of noise characteristics lens-free CMOS photonic array sensors
€193.00
Semiconductor devices bio sensors. Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle
Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
Semiconductor devices - Part 18-5: Semiconductor bio sensors - Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (IEC 60749-41:2020); German version EN IEC 60749-41:2020
€111.40
BS EN IEC 63378-3. Thermal standardization on semiconductor packages Part 3. circuit simulation models of discrete for transient analysis
Semiconductor devices. devices for IoT system Test method of sound variation detection
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2020); German version EN IEC 60749-30:2020.
€98.32
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, stability of flexible resistive memory
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory
