31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
BS IEC 60747-9:2007

BS IEC 60747-9:2007

Superseded Historical

Semiconductor devices. Discrete devices Insulated-gate bipolar transistors (IGBTs)

€374.00

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BS EN 60191-6-18:2010

BS EN 60191-6-18:2010

Active Most Recent

Mechanical standardization of semiconductor devices General rules for the preparation outline drawings surface mounted device packages. Design guide ball grid array (BGA)

€269.00

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BS EN 62047-18:2013

BS EN 62047-18:2013

Active Most Recent

Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materials

€193.00

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BS IEC 60747-3:2013

BS IEC 60747-3:2013

Active Most Recent

Semiconductor devices Discrete devices: Signal, switching and regulator diodes

€316.00

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BS EN 62047-17:2015

BS EN 62047-17:2015

Active Most Recent

Semiconductor devices. Micro-electromechanical devices Bulge test method for measuring mechanical properties of thin films

€316.00

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BS EN 62047-14:2012

BS EN 62047-14:2012

Active Most Recent

Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materials

€193.00

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PD CLC/TR 62258-4:2013

PD CLC/TR 62258-4:2013

Active Most Recent

Semiconductor die products Questionnaire for users and suppliers

€316.00

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BS EN 60749-15:2010

BS EN 60749-15:2010

Superseded Historical

Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices

€165.00

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BS IEC 60747-10:1991

BS IEC 60747-10:1991

Active Most Recent

Semiconductor devices Generic specification for discrete and integrated circuits

€316.00

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BS EN 62047-12:2011

BS EN 62047-12:2011

Active Most Recent

Semiconductor devices. Micro-electromechanical devices Bending fatigue testing method of thin film materials using resonant vibration MEMS structures

€316.00

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BS EN 62374-1:2010

BS EN 62374-1:2010

Active Most Recent

Semiconductor devices Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

€193.00

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BS EN 60191-6-22:2013

BS EN 60191-6-22:2013

Active Most Recent

Mechanical standardization of semiconductor devices General rules for the preparation outline drawings surface mounted device packages. Design guide packages Silicon Fine-pitch Ball Grid Array and Land (S-FBGA S-FLGA)

€193.00

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18/30375624 DC:2018

18/30375624 DC:2018

Active Most Recent

BS EN 60749-20-1. Semiconductor devices. Mechanical and climatic test methods Part 20-1. Handling, packing, labelling shipping of surface-mount devices sensitive to the combined effect moisture soldering heat

€23.00

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BS IEC 60747-19-1:2019

BS IEC 60747-19-1:2019

Active Most Recent

Semiconductor devices Smart sensors. Control scheme of smart sensors

€269.00

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PD IEC TR 60747-5-12:2021

PD IEC TR 60747-5-12:2021

Active Most Recent

Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of LED efficiencies

€404.00

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