31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
DIN EN IEC 60747-16-9:2022-06

DIN EN IEC 60747-16-9:2022-06

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Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters (IEC 47E/768/CD:2021); Text in German and English

€140.00

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NF EN IEC 60749-10, C96-022-10 (06/2022)

NF EN IEC 60749-10, C96-022-10 (06/2022)

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Semiconductor devices - Mechanical and climatic test methods - Part 10 : Mechanical shock - device and subassembly

€65.66

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IEC 63275-2:2022

IEC 63275-2:2022

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Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 2: Test method for bipolar degradation due to body diode operation

€44.00

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22/30430766 DC:2022

22/30430766 DC:2022

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BS EN 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers

€42.00

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DIN EN IEC 60749-15:2022-05

DIN EN IEC 60749-15:2022-05

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Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (IEC 60749-15:2020); German version EN IEC 60749-15:2020.

€77.20

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IEC 60747-5-4:2022

IEC 60747-5-4:2022

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Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

€286.00

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IEC 60749-10:2022

IEC 60749-10:2022

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Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly

€88.00

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IEC 63284:2022

IEC 63284:2022

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Semiconductor devices - Reliability test method by inductive load switching for gallium nitride transistors

€88.00

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IEC 63275-1:2022

IEC 63275-1:2022

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Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability

€88.00

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NF EN IEC 60749-28, C96-022-28 (04/2022)

NF EN IEC 60749-28, C96-022-28 (04/2022)

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Dispositifs à semiconducteurs - Méthodes d'essai mécaniques et climatiques - Partie 28 : Essai de sensibilité aux décharges électrostatiques (DES) - Modèle de dispositif chargé (CDM) - niveau du dispositif

€128.93

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BS EN IEC 62031:2020+A11:2021

BS EN IEC 62031:2020+A11:2021

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LED modules for general lighting. Safety specifications

€269.00

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22/30443678 DC:2022

22/30443678 DC:2022

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BS EN 60749-34-1. Semiconductor devices. Mechanical and climatic test methods Part 34-1. Power cycling for power semiconductor module

€23.00

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22/30451588 DC:2022

22/30451588 DC:2022

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BS EN 63150-3 Ed.1.0. Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Part 3. Human foot impact motion

€23.00

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BS EN IEC 60749-39:2022

BS EN IEC 60749-39:2022

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Semiconductor devices. Mechanical and climatic test methods Measurement of moisture diffusivity water solubility in organic materials used for semiconductor components

€193.00

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IEC 60747-5-14:2022

IEC 60747-5-14:2022

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Semiconductor devices - Part 5-14: Optoelectronic devices - Light emitting diodes - Test method of the surface temperature based on the thermoreflectance method

€176.00

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