31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
IEC 60749-28:2022

IEC 60749-28:2022

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Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level

€325.00

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NF EN IEC 63373, C96-373 (03/2022)

NF EN IEC 63373, C96-373 (03/2022)

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Lignes directrices pour les méthodes d'essai de résistance dynamique à l'état passant des dispositifs de conversion de puissance fondés sur les HEMT en GaN

€95.67

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PR NF EN IEC 63284, C96-284PR (03/2022)

PR NF EN IEC 63284, C96-284PR (03/2022)

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Dispositifs à semiconducteurs - méthode d'essai de fiabilité par la commutation sur charge inductive pour les transistors au nitrure de gallium

€70.11

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22/30437195 DC:2022

22/30437195 DC:2022

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BS IEC 62047-43. Semiconductor devices. Micro-electromechanical devices Part 43. Test method of electrical characteristics after cyclic bending deformation for flexible electro-mechanical

€23.00

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IEC 63373:2022

IEC 63373:2022

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Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices

€88.00

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22/30443234 DC:2022

22/30443234 DC:2022

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BS EN 63378-3. Thermal standardization on semiconductor packages Part 3. circuit simulation models of for transient analysis

€23.00

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PD IEC TR 63378-1:2021

PD IEC TR 63378-1:2021

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Thermal standardization on semiconductor packages resistance and thermal parameter of BGA, QFP type

€269.00

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IEC 60747-5-15:2022

IEC 60747-5-15:2022

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Semiconductor devices - Part 5-15: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage based on the electroreflectance spectroscopy

€88.00

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NF EN IEC 60749-39, C96-022-39 (01/2022)

NF EN IEC 60749-39, C96-022-39 (01/2022)

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Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 39 : mesure de la diffusivité d'humidité et de l'hydrosolubilité dans les matériaux organiques utilisés dans les composants à semiconducteurs

€65.66

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IEC TR 63378-1:2021

IEC TR 63378-1:2021

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Thermal standardization on semiconductor packages - Part 1: Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages

€127.00

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21/30440970 DC:2021

21/30440970 DC:2021

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BS EN IEC 60747-5-16. Semiconductor devices Part 5-16. Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on photocurrent spectroscopy

€23.00

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BS EN IEC 63287-1:2021

BS EN IEC 63287-1:2021

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Semiconductor devices. Generic semiconductor qualification guidelines Guidelines for IC reliability

€355.00

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IEC 60749-39:2021

IEC 60749-39:2021

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Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

€88.00

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PD IEC TR 60747-5-12:2021

PD IEC TR 60747-5-12:2021

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Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of LED efficiencies

€404.00

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BS EN IEC 63244-1:2021

BS EN IEC 63244-1:2021

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Semiconductor devices. devices for wireless power transfer and charging General requirements specifications

€316.00

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