Semiconductor devices. devices for energy harvesting and generation Test evaluation methods of flexible stretchable supercapacitors use in low power electronics
€316.00
Modules à LED pour éclairage général - Spécifications de sécurité
€28.06
Organic Light Emitting Diode (OLED) light sources for general lighting - Safety - Part 2-2 : Particular requirements for integrated OLED modules
€77.96
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 8: Test and evaluation methods of flexible and stretchable supercapacitors for use in low power electronics
€286.00
Semiconductor devices - Part 5-12: Optoelectronic devices - Light emitting diodes - Test method of LED efficiencies
€418.00
Electronic components. Long-term storage of electronic semiconductor devices Special cases
€193.00
Static VAR compensators (SVC) - Testing of thyristor valves
€325.00
Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1 : General requirements and specifications
€138.19
Electronic components - Long-term storage of electronic semiconductor devices - Part 9 : Special Cases
€82.01
Semiconductor devices. Micro-electromechanical devices Test methods of micro-electromechanical inertial shock switch threshold
€165.00
Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length
Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold
€44.00
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
Printed electronics - Part 503-3: Quality assessment - Measuring method of contact resistance for the printed thin film transistor - Transfer length method
€88.00