High-voltage direct current (HVDC) installations - System tests
€968.00
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
€176.00
Semiconductor devices - Standardization roadmap of fault test method for automotive vehicles
€88.00
Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors Test bias temperature instability
€193.00
Dispositifs optoélectroniques à semiconducteurs pour application dans les systèmes à fibres optiques - Partie 1 : Modèle de spécification relatif aux valeurs et caractéristiques essentielles
€59.50
LED modules for general lighting - Safety specifications
€36.00
Amendment 1 - Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
€11.00
Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
€506.00
Semiconductor devices - Micro-electromechanical devices - Part 42: Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Procedure identifying and evaluating using a combined method optical inspection photoluminescence
€269.00
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). level
€374.00
Semiconductor devices. Mechanical and climatic test methods shock. device subassembly
IEC 63068-4:2022 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4: Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on electroreflectance spectroscopy
€183.00
Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
