Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
€165.00
Semiconductor devices. Mechanical and climatic test methods shock
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level
€355.00
Teleweb application Superteletext profile
€404.00
Mechanical standardization of semiconductor devices General rules for the preparation outline drawings surface mounted device packages Dimensions P-VSON
€193.00
Mechanical standardization of semiconductor devices. General rules for the preparation outline drawings surface mounted device packages Design guide 1,50 mm, 1,27 mm and 1,00 pitch ball column terminal
Reliability data handbook. Universal model for reliability prediction of electronics components, PCBs and equipment
Semiconductor devices. Micro-electromechanical devices Tensile testing method of thin film materials
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz radiated emissions. TEM cell and wideband method
€269.00
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
Semiconductor devices. Micro-electromechanical devices Thin film standard test piece for tensile testing
Automatic electrical controls for household and similar use General requirements
Semiconductor devices. Discrete devices Optoelectronic lasers
