Semiconductor devices. Mechanical and climatic test methods Die shear strength
€165.00
Semiconductor devices. Mechanical and climatic test methods Preconditioning of non-hermetic surface mount devices prior to reliability testing
€193.00
Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement the analysis of other residual gases
Semiconductor devices. Mechanical and climatic test methods High temperature operating life
Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (externally induced)
Semiconductor devices. Mechanical and climatic test methods Solderability
€269.00
Semiconductor devices. Mechanical and climatic test methods Latch-up
Semiconductor devices. Mechanical and climatic test methods Power cycling
Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification
Semiconductor devices. Micro-electromechanical devices Micro-pillar compression test for MEMS materials
Semiconductor devices. Micro-electromechanical devices Test method for coefficients of linear thermal expansion free-standing materials micro-electromechanical systems
Semiconductor devices. Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
Mechanical standardization of semiconductor devices General rules for the preparation outline drawings surface mounted device packages. Design guidelines fine-pitch land grid array (FLGA)
Semiconductor devices. Micro-electromechanical devices Test method of bonding strength between PDMS and glass
Hand-held motor-operated electric tools. Safety General requirements
€404.00
