Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life
€193.00
BS EN IEC 62047-49. Semiconductor devices. Micro-electromechanical devices Part 49. Reliability test methods of electro-mechanical conversion characteristics piezoelectric MEMS cantilever
€23.00
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 5 : essai continu de durée de vie sous température et humidité avec polarisation
€77.96
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
€44.00
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly (IEC 60749-10:2022); German version EN IEC 60749-10:2022.
€91.03
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 60749-37:2022); German version EN IEC 60749-37:2022.
€105.42
Technologies et dispositifs électroniques prêt-à-porter - Partie 401-1 : dispositifs et systèmes : éléments de fonctionnement - Méthode d'évaluation de la jauge de contrainte extensible de type résistif
€111.96
BS EN IEC 62047-4 Semiconductor devices. Micro-electromechanical devices Part 4. Generic specification for MEMS
BS IEC 63512. Test method for continuous-switching evaluation of gallium nitride power conversion devices
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (IEC 63287-1:2021); German version EN IEC 63287-1:2021.
€145.14
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
€269.00
BS IEC 62047-48. Semiconductor devices. Micro-electromechanical devices Part 48. Test method of determining solution concentration by optical absorption using MEMS fluidic device
BS EN IEC 63287-3. Semiconductor devices. Generic semiconductor qualification guidelines Part 3. Guidelines for reliability plans power module
Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices (IEC 63373:2022); German version EN IEC 63373:2022
BS EN IEC 62007-2. Semiconductor optoelectronic devices for fibre optic system applications Part 2. Measuring methods
