Modules LED - Exigences de sécurité
€125.23
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
€65.00
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
€72.00
Draft BS EN 63378-6 ED1. Thermal standardization on semiconductor packages Part 6. resistance and capacitance model for transient temperature prediction at junction measurement points
€23.00
Draft BS EN 60747-14-12 ED1 Semiconductor devices Part 14-12: sensors - Performance test methods for CMOS imager-based gas
BS EN IEC 62031 LED modules. Safety requirements
Standard Specification for Gold Wire for Semiconductor Lead Bonding
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters (IEC 60747-16-8:2022); German version EN IEC 60747-16-8:2023
€128.22
Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators (IEC 60747-16-7:2022); German version EN IEC 60747-16-7:2023
€140.00
BS IEC 60747-5-18 Semiconductor devices Part 5-18: Optoelectronic - Light emitting diodes Test method light diodesof the macro photoluminescence for epitaxial wafers of micro
Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical
€193.00
Semiconductor devices - Micro-electromechanical devices - Part 43: Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices
€127.00
BS EN IEC 62047-50. Semiconductor devices. Micro-electromechanical devices Part 50. MEMS capacitive microphone
Semiconductor devices. Micro-electromechanical devices Test methods for dynamic performances of MEMS resonant electric-field-sensitive
€183.00
Semiconductor devices - Micro-electromechanical devices - Part 44: Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices
