Semiconductor devices. devices for energy harvesting and generation Linear sliding mode triboelectric
€316.00
BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
€23.00
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Test method using photoluminescence
€269.00
Semiconductor devices. Discrete devices Microwave diodes and transistors
€404.00
BS EN 61643-321. Components for low-voltage surge protective devices Part 321. Performance requirements and test circuits silicon PN-junction voltage limiters
Semiconductor devices Optoelectronic devices. Hydrogen sulphide corrosion test for LED packages
€193.00
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
IEEE Guide for the Application of Thyristor Surge Protective Device Components
€135.00
Semiconductor devices Discrete devices. Rectifier diodes
€355.00
Semiconductor devices. Discrete devices Isolated power semiconductor
Semiconductor devices. Micro-electromechanical devices Test method for adhesion strength of metal powder paste in MEMS interconnection
Semiconductor devices. Micro-electromechanical devices RF MEMS circulators and isolators
Semiconductor devices. Micro-electromechanical devices Test methods of micro-electromechanical inertial shock switch threshold
€165.00
